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Electron Microscope
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  • 고객지원
 - Non Contact 
 - Fast, Robust 
 - Versatile Interferometry Optical Metrology
NanoX-2000 series are non-contact, fast, robust, versatile, and ease of use interferometry
3D optical profiler metrology systems.
They have world best CoO and wide range measurement applications, MEMS,
Semiconductor manufacturing, PV cell and LED manufacturing, precision machining,
surface roughness, nano surface defects, and many others.