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Electron Microscope
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  • 고객지원

- Direct detection of low keV primary electrons—a revolutionary advancement for LEEM/PEM
- High signal-to-noise ratio (SNR) and a large field-of-view delivers >6× 
  the informationcontent compared to microchannel plateswith a CCD
- Extensible and open software to easilyintegrate with custom workflows 
  andmaximize image processing capabilities